Instituto de Óptica "Daza de Valdés" Español | English

Measuring the reflectance and the internal quantum efficiency of silicon and InGaAs/InP photodiodes in near infrared range  
Publication year:    2008
Reference:    Zurita, A.L.M., Acosta, J.C., Shcherbakov, A.S., Aglio, A.P. “Measuring the reflectance and the internal quantum efficiency of silicon and InGaAs/InP photodiodes in near infrared range”. Proceedings of SPIE (2008), 6890.
Magazine:    Proceedings of SPIE (2008)
 
Investigación financiada por el Ministerio de Ciencia e Innovación y la Agencia Estatal de Investigación
Instituto de Óptica "Daza de Valdés"
(IO-CSIC)
C/ Serrano, 121
28006 Madrid (España)
Tel: 915 616 800
Consejo Superior de Investigaciones Científicas - Instituto de Óptica twitter twitter twitter twitter
If you have been part of the CSIC, join Alumni
Dorotea Barnés Library
Links | Contact | Legal advise | Intranet| IO-CSIC 75 years exhibition | María Teresa Vigón Photographic Fund